US 11,688,056 B2 · Method for predicting defects in assembly units

Abstract

One variation of a method for predicting manufacturing defects includes: accessing a first set of inspection images of a first set of assembly units recorded by an optical inspection station over a first period of time; generating a first set of vectors representing features extracted from the first set of inspection images; grouping neighboring vectors in a multi-dimensional feature space into a set of vector groups; accessing a second inspection image of a second assembly recorded by the optical inspection station at a second time succeeding the first period of time; detecting a second set of features in the second inspection image; generating a second vector representing the second set of features in the multi-dimensional feature space; and, in response to the second vector deviating from the set of vector groups by more than a threshold difference, flagging the second assembly unit.

Claims20

Dependent claims

A method for predicting manufacturing defects, the method comprising:

accessing a first set of inspection images of a first set of assembly units, of an assembly type, recorded by an optical inspection station during production of the first set of assembly units within a first period of time;
for each inspection image in the first set of inspection images:
dividing a portion of the inspection image depicting an assembly unit into a set of image segments;
and
for each image segment in the set of image segments:
detecting a set of features in the image segment;
and
generating a feature container, in a first set of feature containers, representing the set of features in a multi-dimensional feature space;
identifying a first cluster of neighboring feature containers, in the set of feature containers, occupying a first region of the multi-dimensional feature space;
identifying a first feature container, in the first set of feature containers, occupying a second region of the multi-dimensional feature space outside of the first region of the multi-dimensional feature space;
and
flagging a first assembly unit, in the first set of assembly units, corresponding to the first feature container.

9 more elements

A method for predicting manufacturing defects, the method comprising:

accessing a set of inspection images of a set of assembly units recorded by a set of optical inspection stations during production of the set of assembly units;
for each inspection image in the first set of inspection images:
dividing a portion of the inspection image depicting an assembly unit into a set of image segments;
and
for each image segment in the set of image segments:
detecting a set of features in the image segment;
and
generating a feature container, in a first set of feature containers, representing the set of features in a multi-dimensional feature space;
identifying a first cluster of neighboring feature containers, in the set of feature containers, occupying a first region of the multi-dimensional feature space;
identifying a first feature container, in the first set of feature containers, occupying a second region of the multi-dimensional feature space outside of the first region of the multi-dimensional feature space;
and
flagging a first assembly unit, in the first set of assembly units, corresponding to the first feature container.

9 more elements

Dependencies are inferred from the claim text.

Method for predicting defects in assembly units

Life of this patent

Method for predicting defects in assembly units

Life of this patent

Abstract

Claims20