Self-test for low dropout regulator measurement

Abstract

The present disclosure describes systems and methods for identifying defective components in a power integrated circuit. In one such system, a voltage regulator circuit is embedded in an integrated circuit device, wherein the voltage regulator circuit includes a control feedback loop having a compensation capacitor that is configured to maintain a stable output voltage of the voltage regulator voltage at a set value or range. Additionally, a test circuitry is embedded in the integrated circuit device, wherein the test circuitry comprises a voltage source that is configured to generate a cyclical test input signal that passes through the control feedback loop. Accordingly, the test circuitry is configured to provide a test output signal to an output pin of the integrated circuit device that indicates a performance level of the compensation capacitor in the control feedback loop of the voltage regulator circuit. Other systems and methods are also included.

Dependencies are inferred from the claim text.