Back to results
US 11,687,000 B2Granted
Sulfonium compound, chemically amplified resist composition, and patterning process
AssigneeShin-Etsu Chemical Co., Ltd.
InventorsMasahiro Fukushima, Masaki Ohashi, Kazuhiro Katayama, Yuki Kera
Life of this patent
Estimating the term…
Abstract
A novel sulfonium compound of formula (A) and a chemically amplified resist composition comprising the same as a PAG are provided. When processed by photolithography using KrF or ArF excimer laser, EB or EUV, the resist composition has a high sensitivity and reduced acid diffusion and is improved in lithography properties.
Claims20
A sulfonium compound having the formula (A):
- wherein Q1 and Q2 are each independently fluorine or a C1-C6 fluoroalkyl group,
- Q3 and Q4 are each independently hydrogen, fluorine or a C1-C6 fluoroalkyl group,
- a is an integer of 1 to 4,
- b is 1 or 2,
- c is an integer of 0 to 3,
- La1 to La4 are each independently a single bond, ether bond, ester bond, sulfonic acid ester bond, carbonate bond or carbamate bond,
- XL1 and XL2 are each independently a single bond or a C2-C40 divalent hydrocarbon group which may contain a heteroatom,
- Ra is hydrogen or a C1-C20 monovalent hydrocarbon group which may contain a heteroatom,
- Rb and Rc are each independently a C2-C40 monovalent hydrocarbon group which may contain a heteroatom, Rb and Rc may bond together to form a ring with the oxygen atoms to which they are attached and the intervening carbon atom,
- R1 is a C1-C50 (a+1)-valent hydrocarbon group which may contain a heteroatom,
- R2 is a C1-C50 monovalent hydrocarbon group which may contain a heteroatom,
- R3 is a C1-C50 divalent hydrocarbon group which may contain a heteroatom,
- in the case of b=1, R1 and R2, or R2 and R3 may bond together to form a ring with the sulfur atom to which they are attached, and in the case of b=2, R1 and R3, or two R1 may bond together to form a ring with the sulfur atom to which they are attached.
10 more elements
Dependencies are inferred from the claim text.