Scanning microscope

A method for microscope scanning of a sample, the method comprising:

• focusing, by an objective arranged in an illuminating beam path, an illuminating light bundle onto the sample;
• deflecting, by a scanning unit arranged upstream of the objective in the illuminating beam path, the illuminating light bundle in such a way that the illuminating light bundle focused by the objective executes a scanning movement on the sample;
• and
• receiving, by a detection unit arranged in a detection beam path, a detection light bundle not deflected by the scanning unit, wherein for spectral influencing of the detection light bundle, the detection unit contains at least one spectrally selective component which has an active surface with a spectral edge which varies with a location of incidence of the detection light bundle on the active surface of the spectrally selective component,
• wherein the active surface of the spectrally selective component is arranged in the detection beam path at a location of an image of an objective pupil.