Path loss compensation for comparator
AssigneeAnalog Devices, Inc.
InventorsChristopher C. McQuilkin, Andrew Nathan Mort
Life of this patent
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Abstract
A test system can receive a test signal from a device under test (DUI) via a first signal path. A comparator circuit can receive the test signal and, in response, generate an intermediate output signal based on a magnitude relationship between the test signal a comparator reference signal. A compensation circuit can generate a correction signal that is complementary to a portion of the received test signal, such as to correct for loading effects of the first signal path. The test system can include an output circuit configured to provide a corrected differential output signal that is based on a combination of the intermediate output signal and the correction signal.
Claims20
A method comprising:
- receiving a test signal from a device under test (DUT) at an input node of a comparator;
- generating an intermediate output signal based on a relationship between the test signal from the DUT and a comparator reference signal;
- providing a DC-coupled signal based on the relationship between the test signal from the DUT and the comparator reference signal;
- generating an AC-coupled correction signal using the DC-coupled signal, the correction signal complementary to a portion of the received test signal;
- and
- providing a corrected output signal based on a combination of the intermediate output signal and the correction signal.
A system for monitoring information from a device under test (DUT), the system comprising:
- a DUT input node configured to receive a test signal from a DUT via a. first signal path;
- a comparator circuit coupled to the NIT input node and configured to generate an intermediate output signal based on a relationship between the test signal from the DUT and a comparator reference signal;
- a compensation circuit coupled to the DUT input node and configured to generate a correction signal to compensate for a portion of the received test signal;
- and
- an output circuit configured to provide a corrected output signal based on a combination of the intermediate output signal and the correction signal.
A test system comprising:
- a first differential pair circuit configured to generate an intermediate output signal based on a relationship between a test signal received from a device under test (DUT) and a reference signal;
- a path loading compensation circuit configured to generate an AC-coupled correction signal complementary to a portion of the received test signal, wherein the compensation circuit comprises a transconductance stage configured to provide a DC-coupled intermediate signal to a gain stage, and a signal shaping filter stage configured to provide the correction signal based on an output signal from the gain stage;
- and
- an output circuit configured to provide a corrected output signal based on a combination of the intermediate output signal and the correction signal.
Dependencies are inferred from the claim text.