Self diagnostic apparatus for electronic device

A self diagnostic apparatus for an electronic device, comprising:

• a vector memory configured to store a test function code for testing a device under test (DUT) equipped with a plurality of cores which perform arithmetic operations, a function test expected value corresponding to a function test according to the test function code, a design for test (DFT) test code, a DFT test expected value corresponding to a DFT test according to the DFT test code, and a non-test function code for a general arithmetic operation or an operation of the DUT;
• a test data storage configured to store test data including a DFT test code result value which is a result of the DFT test according to the DFT test code, a test function code result value which is a result of the function test according to the test function code, and a non-test function code result value which is a result of the function test according to the non-test function code;
• and
• a safety region test controller configured to select one among the test function code, the DFT test code, and the non-test function code to select a test mode, control an environmental variable of a test signal applied to the DUT in response to the selected test mode and test the DUT, compare the function test expected value stored in the vector memory with the test function code result value stored in the test data storage, and compare the DFT test expected value stored in the vector memory with the DFT test code result value stored in the test data storage to output comparison result information.