Built-in self-test circuit and temperature measurement circuit including the same

A temperature measurement circuit comprising:

• a temperature detection circuit comprising:
• an analog circuit configured to generate a measurement reference voltage that is fixed regardless of an operation temperature and a temperature-variant voltage that varies depending on the operation temperature;
• and
• an analog-digital converter circuit configured to generate a digital code indicating the operation temperature based on the measurement reference voltage and the temperature-variant voltage;
• and
• an analog built-in self-test (BIST) circuit configured to generate, for each of a plurality of voltages of the analog circuit, a respective flag signal indicating whether the voltage is within a respective predetermined range.

A built-in self-test (BIST) circuit configured to monitor a temperature detection circuit including an analog circuit and an analog-digital converter circuit, the BIST circuit comprising:

• an analog BIST circuit configured to generate, for each of a plurality of monitoring voltages of the analog circuit, a respective flag signal indicating whether the monitoring voltage is within a respective predetermined range;
• and
• a digital BIST circuit configured to
• apply a test signal to the analog-digital converter circuit in a test mode, and
• based on a response of the analog-digital converter circuit to the test signal, an alarm signal indicating an operation state of the analog-digital converter circuit.