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AssigneeAnalog Devices International Unlimited Company
InventorsEdward John Coyne, Alan J. O'Donnell, Shaun Bradley, David Aherne, David Boland, Thomas G. O'Dwyer, Colm Patrick Heffernan, Kevin B. Manning, Mark Forde, David J. Clarke, Michael A. Looby
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The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.
An exposure monitor device comprising:
An exposure monitor device comprising:
An exposure monitor device comprising:
Dependencies are inferred from the claim text.