System and method for real-time visualization of defects in a material

A system for non-destructive testing of composite materials, comprising:

• an ultrasonic transducer in communication with a processor, a material database, and a display means;
• wherein the ultrasonic transducer is operable to emit ultrasonic waves into and receive ultrasonic waves from a test object;
• wherein the test object includes a multiplicity of components, with at least one bond layer disposed between two adjacent components;
• wherein based on the ultrasonic waves received by the ultrasonic transducer, the processor generates a plurality of values corresponding to the thickness of the at least one bond layer at each point along a length and width of the at least one bond layer;
• wherein the processor generates a plurality of A-scans of the test material at defined intervals and receives a full waveform for each A-scan of a material;
• wherein based on the full waveform received, the processor generates a plurality of B-scans corresponding to different depths of the test material and calculates a maximum intensity value for each of the B-scans;
• wherein the material database contains information regarding a plurality of materials;
• and
• wherein the processor matches a material of the at least one bond layer to at least one of the plurality of materials.

A system for non-destructive testing of composite materials, comprising:

• an ultrasonic transducer in communication with a processor and a display means;
• wherein the ultrasonic transducer is operable to emit ultrasonic waves into and receive ultrasonic waves from a test object;
• wherein the test object includes a multiplicity of components, with at least one bond layer disposed between two adjacent components;
• wherein based on the ultrasonic waves received by the ultrasonic transducer, the processor generates a first set of values corresponding to a depth of a top surface of the at least one bond layer and a second set of values corresponding to a depth of the bottom surface of the at least one bond layer at each point along a length and width of the at least one bond layer;
• and
• wherein the processor generates a plurality of A-scans of the test material at defined intervals and receives a full waveform for each A-scan of a material;
• wherein based on the full waveform received, the processor generates a plurality of B-scans corresponding to different depths of the test material and calculates a maximum intensity value for each of the B-scans.