US 11,686,677 B2Granted

Systems and methods for leak monitoring via measurement of optical absorption using tailored reflector installments

AssigneeMultiSensor Scientific, Inc.

InventorsAllen M. Waxman, Stefan Bokaemper, Terrence K. Jones, Claude V. Robotham

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Abstract

Presented herein are systems and methods directed to a multispectral absorption-based imaging approach offering improved detection, localization, and quantification of gas emission. The imaging technology described herein utilizes an optical sensor and broadband illumination in combination with specialized reflector installments mounted about the site. The optical sensor detects light (e.g., reflected) from locations along the reflector installment. Lines-of-sight from the optical sensor to locations along the reflector installment sweep out an “optical curtain” partially enclosing and/or forming a boundary near various assets to be monitored. Optical absorption signatures from leaking gas crossing the optical curtain can be used to detect, localize, and obtain quantitative measures characterizing the leak. Measurements from reflector installments can be combined with measurements obtained via reflection of ambient light from background materials in a hybrid approach that expands monitoring capabilities and offers improvements in detection.

Claims28

Dependent claims

A method of generating a spectral absorption map for detecting emission of gas comprising one or more compounds of interest, the method comprising:

(a) positioning an instantaneous field of view (ifov) of an optical sensor toward a reflector installment mounted about a site to be monitored and within a target region;
(b) directing a beam of illumination from an illumination source and toward the reflector installment;
(c) scanning the beam of illumination across at least a portion of the reflector installment, thereby illuminating a plurality of sampled locations on the reflector installment;
(d) detecting, with one or more detectors of the optical sensor, light within one or more spectral bands of interest, at least a portion of which overlap with one or more spectral features associated with the one or more compounds of interest, wherein the detected light comprises:
(i) reflected illumination light corresponding to light from the beam of illumination having been reflected from the plurality of sampled locations on the reflector installment and captured within the ifov of the optical sensor, and
(ii) reflected ambient light having been reflected from a plurality of additional sampled locations and captured within the ifov of the optical sensor, the plurality of additional sample locations within the target region, but not on the reflector installment;
(e) receiving and/or accessing, by a processor of a computing device, data corresponding to the detected light, comprising both (i) the reflected illumination light and (ii) the reflected ambient light;
and
(f) determining, by the processor, for each of (i) at least a portion of the plurality of sampled locations on the reflector installment and (ii) at least a portion of the plurality of additional sampled locations, an absorption level associated with at least one of the one or more spectral features using the detected light, thereby generating a spectral absorption map comprising a plurality of absorption levels, each associated with a:
(i) a particular sampled location on the reflector installment or a particular additional sampled location and (ii) a spectral feature.

7 more elements

A system for generating a spectral absorption map for detecting emission of gas comprising one or more compounds of interest, the system comprising:

(a) a reflector installment mounted about a site to be monitored within a target region;
(b) a scanning illuminator positioned in proximity to the reflector installment aligned and operable to emit and direct a structured illumination beam towards the reflector installment and scan the structured illumination beam across at least a portion of the reflector installment, thereby illuminating a plurality of sampled locations;
(c) an optical sensor positioned in proximity to the reflector installment comprising one or more detectors, wherein:
the one or more detectors are aligned and operable to detect light within one or more spectral bands of interest, at least a portion of said spectral bands of interest overlapping with one or more spectral features associated with the one or more compounds of interest, and
the one or more detectors are aligned to detect:
(i) reflected illumination light corresponding to light from the beam of illumination having been reflected from the plurality of sampled locations on the reflector installment and captured within an instantaneous field of view (ifov) of the optical sensor, and
(ii) reflected ambient light having been reflected from a plurality of additional sample locations and captured within the ifov of the optical sensor, the plurality of additional sampled locations within the target region, but not on the reflector installment
(d) a processor of a computing device;
and
(e) a memory having instructions stored thereon, wherein the instructions, when executed by one processor, cause the processor to:
receive and/or access data corresponding to the detected light, comprising both (i) the reflected illumination light and (ii) the reflected ambient light;
and
determine, for each of (i) at least a portion of the plurality of sampled locations on the reflector installment and (ii) at least a portion of the plurality of additional sampled locations, an absorption level associated with at least one of the one or more spectral features using the detected light, thereby generating a spectral absorption map comprising a plurality of absorption levels, each associated with:
(i) a particular sampled location on the reflector installment or a particular additional sampled location and (ii) a spectral feature.

11 more elements

Dependencies are inferred from the claim text.

Facts

Application: 17/424,311Filed 24 Jan 2020 · continuation in part
Priority: 25 Jan 2019
Published: US 2022/0099568 A131 Mar 2022
Granted: 27 Jun 2023
Term ends: Not estimatedThe source records don’t support an estimate.

Classification9 codes

G01M 3/38
Investigating fluid-tightness of structures: by using light
G01N 21/359
Using infrared light: using near infrared light
G01M 3/202
Using special tracer materials, e.g. dye, fluorescent material, radioactive material: using mass spectrometer detection systems
G01N 21/3504
Using infrared light: for analysing gases, e.g. multi-gas analysis

Family

Application62/797,065Us provisional application · filed 25 Jan 2019
Application16/413,272Parent of this continuation-in-part · filed 15 May 2019
US 10,976,245 B2Parent of this continuation-in-part · filed 13 Apr 2021
US 2022/0099568 A1Pre-grant publication · published 31 Mar 2022
US 2020/0240906 A1Published application
US 11,686,677 B2This patent

From the US filing history. Foreign family members aren’t listed.