Analysis device

An analysis device which performs component analysis of an analyte, the analysis device comprising:

• an electromagnetic wave emitter that emits a primary electromagnetic wave for analysis of the analyte;
• a reflective object lens for collecting a secondary electromagnetic wave generated on the analyte due to the emission of the primary electromagnetic wave that has a primary mirror, having an opening at a radial center, which is provided a primary reflection surface around the opening to reflect the secondary electromagnetic wave, and a secondary mirror which is provided a secondary reflection surface to receive and further reflect the secondary electromagnetic wave reflected by the primary reflection surface;
• a detector that receives the secondary electromagnetic wave generated on the analyte and collected by the reflective object lens, and generates an intensity distribution spectrum which is an intensity distribution for each wavelength of the secondary electromagnetic wave;
• and
• a processor that performs the component analysis of the analyte based on the intensity distribution spectrum generated by the detector,
• wherein the secondary reflection surface is provided at an outer edge of the secondary mirror, and a transmissive region through which the primary electromagnetic wave is transmitted is provided at a center of the secondary mirror,
• the transmissive region is configured to emit the primary electromagnetic wave along an optical axis of the reflective object lens by transmitting the primary electromagnetic wave emitted from the electromagnetic wave emitter and passed through the opening, and
• the reflective object lens is configured to emit the primary electromagnetic wave to the analyte by passing through the opening and transmitting through the transmissive region, and is configured to guide the secondary electromagnetic wave generated on the analyte by irradiating the analyte with the primary electromagnetic wave to the opening by reflecting the secondary electromagnetic wave with the primary reflection surface and the secondary reflection surface.