Characterization and sorting for particle analyzers
AssigneeBecton, Dickinson and Company
InventorsJoseph Trotter, Paul Barclay Purcell
Life of this patent
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AssigneeBecton, Dickinson and Company
InventorsJoseph Trotter, Paul Barclay Purcell
Estimating the term…
Some embodiments of the methods provided herein relate to sample analysis and particle characterization methods. Some such embodiments include receiving, from a particle analyzer, measurements for a first portion of particles associated with an experiment. Some embodiments also include generating a tree representing groups of related particles based at least in part on the measurements, wherein the tree includes at least three groups. Some embodiments also include generating a measure of relatedness between a first group and a second group of the tree based at least in part on the measurements. Some embodiments also include and configuring the particle analyzer to classify a subsequent particle associated with the experiment with the first group real-time, wherein the subsequent particle is not included in the first portion of particles. Some embodiments also include sorting the subsequent particle.
A method of computationally configuring a particle analyzer, the method comprising:
A computer-readable storage medium comprising instructions that, when executed by the one or more processing devices, causes the system to,
Dependencies are inferred from the claim text.