Imaging device and calibration method

An imaging device comprising:

• a processing unit formed on a first semiconductor substrate and configured to perform predetermined image processing on the basis of image data obtained by an imaging unit;
• a first temperature sensor formed on the first semiconductor substrate and capable of generating a detection signal according to a first temperature;
• a first pad electrode formed on the first semiconductor substrate, wherein the first pad electrode is configured to contact a probe needle to detect a second temperature by a second temperature sensor;
• a storage unit configured to store information about the second temperature detected by the second temperature sensor;
• and
• a calculation unit capable of generating a temperature code by respectively performing different types of arithmetic processing from one another in a plurality of divided temperature ranges in each of which the first temperature sensor is operable, on the basis of the detection signal,
• wherein the calculation unit is capable of performing correction processing of correcting the temperature code, using the information stored in the storage unit.