Radiometric measurement device
AssigneeBerthold Technologies GmbH & Co. KG
InventorsSteffen Mueller, Joerg Baeuerle
Life of this patent
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Abstract
A radiometric measurement device includes a number n of sensors, wherein a respective sensor of the number n of sensors is configured to generate associated sensor data, such that overall a number n of sensor data is generated by means of the number n of sensors. A measurement variable calculation unit is configured to calculate a number m of measurement variable values depending on the number n of sensor data on the basis of values of a number d of parameters. A learning unit is configured to calculate the values of the number d of parameters on the basis of training data.
Claims4
An apparatus, comprising:
- a process metrology radiometric measurement device, the radiometric measurement device comprising:
- a number n of sensors, wherein a respective sensor of the number n of sensors is configured to generate associated sensor data, such that overall a number n of sensor data is generated by way of the number n of sensors;
- a measurement variable calculation unit configured to calculate a number m of process measurement variable values depending on the number n of sensor data on the basis of values of a number d of parameters;
- and
- a learning unit, wherein the learning unit is configured to calculate the values of the number d of parameters on the basis of training data, wherein
- the radiometric measurement device self-calibrates via the learning unit, and
- at least one process measurement variable is selected from a set of process measurement variables comprising:
- filling level of a material,
- positions and/or thicknesses of individual material layers of a material,
- material density,
- conveyed mass of a material,
- mass flow rate of a material throughput.
Dependencies are inferred from the claim text.