Method for depositing a ruthenium-containing film on a substrate by a cyclical deposition process
AssigneeASM IP Holding B.V.
InventorsMatthias Minjauw, Jolien Dendooven, Christophe Detavernier
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AssigneeASM IP Holding B.V.
InventorsMatthias Minjauw, Jolien Dendooven, Christophe Detavernier
Estimating the term…
A method for depositing a ruthenium-containing film on a substrate by a cyclical deposition process is disclosed. The method may include: contacting the substrate with a first vapor phase reactant comprising a metalorganic precursor, the metalorganic precursor comprising a metal selected from the group consisting of platinum, aluminum, titanium, bismuth, zinc, and combination thereof. The method may also include; contacting the substrate with a second vapor phase reactant comprising ruthenium tetroxide, wherein the ruthenium-containing film comprises at least one of a ruthenium-platinum alloy, or a ternary ruthenium oxide. Device structures including a ruthenium-containing film deposited by the methods of the disclosure are also disclosed.
A method of depositing a ruthenium-containing film on a substrate by a cyclical deposition process, the method comprising:
A method of depositing a ternary ruthenium oxide film on a substrate by a cyclical deposition process, the method comprising:
Dependencies are inferred from the claim text.