Intelligent manufacturing industrial Internet of Things based on distributed control, control methods and media thereof

A control method for an intelligent manufacturing industrial Internet of Things based on distributed control, which is applied to a user platform, a service platform, a management platform, a sensor network platform, and an object platform interacting in sequence, wherein

• the service platform is provided with a plurality of independent service sub-platforms;
• the management platform is provided with a general management platform and a plurality of independent management sub-platforms, the management sub-platforms interacting with the general management platform, and the management sub-platforms interacting with the corresponding service sub-platforms;
• the sensor network platform is provided with a general sensor network platform and a plurality of independent sensor network sub-platforms, the sensor network sub-platforms interacting with the general sensor network platform;
• and
• the control method comprises:
• receiving, by the plurality of sensor network sub-platforms, defect data of products detected by different defect detection devices in the object platform respectively;
• summarizing all the defect data and sending them to the general management platform uniformly by the general sensor network platform;
• revising production parameters of a target production device in the object platform according to the plurality of defect data, and sending the revised production parameters and the corresponding defect data as reference data to the target production device and the management sub-platform corresponding to the target production device by the general management platform;
• and
• storing the reference data and sending the reference data to the user platform through the corresponding service sub-platform by the management sub-platform;
• and displaying the reference data to a user by the user platform, wherein
• the general management platform is configured with a defect analysis model and a defect revising model;
• the general management platform inputs the defect data into the defect analysis model and receives analysis data outputted by the defect analysis model;
• the general management platform inputs the analysis data into the defect revising model and determines data outputted by the defect revising model as the revised production parameters;
• the defect analysis model is configured with first data and second data;
• the first data is benchmark data corresponding to the defect data;
• the second data is a contribution percentage of the production parameters of each production device corresponding to the defect data;
• and
• when the general management platform inputs the defect data into the defect analysis model, the defect analysis model generates differential data by comparing the defect data and the corresponding first data and calculates the contribution percentage of the production parameters of each production device of all the differential data as the analysis data based on the second data.