Non-destructive inspection method
AssigneesKonica Minolta, Inc., Spin Sensing Factory Corp.
InventorsMasahiro Imada, Takuji Hatano, Koujirou Sekine, Masaaki Tsuchida, Tsukasa Yagi
Life of this patent
Estimating the term…
Loading patent…
AssigneesKonica Minolta, Inc., Spin Sensing Factory Corp.
InventorsMasahiro Imada, Takuji Hatano, Koujirou Sekine, Masaaki Tsuchida, Tsukasa Yagi
Estimating the term…
A non-destructive inspection method of inspecting an inspection target using multiple different types of non-destructive inspection means that include one non-destructive inspection means and at least one other non-destructive inspection means. The method includes determining a marking position on the inspection target in a detection result by the one non-destructive inspection means, causing a device to store the marking position, and fixedly forming a mark on the inspection target corresponding to the marking position. The mark is detectable by the other non-destructive inspection means. The method further includes causing the other non-destructive inspection means to inspect an inspection target including the mark. The method further includes contrasting detection results by the multiple different types of non-destructive inspection means in reference to the mark which is the marking position.
A non-destructive inspection method of inspecting an inspection target using multiple different types of non-destructive inspection means that include one non-destructive inspection means and at least one other non-destructive inspection means, the method comprising:
Dependencies are inferred from the claim text.