Edge phase effects removal using wavelet correction and particle classification using combined absorption and phase contrast

A method for material analysis, wherein the material comprises particles with two or more phases where the phases have chemistries with insignificant density differences, and amorphous or crystalline states, the method comprising:

• obtaining a set of x-ray projections containing absorption and phase information for reconstruction of a tomography of a sample;
• obtaining a first reconstructed volume dataset;
• obtaining morphological edge information from the first reconstructed volume dataset using wavelet based filtering to remove particle edge phase effects from the reconstructed volume dataset;
• and
• classifying particles within the sample;
• wherein before classifying the particles, the method further comprises one of:
• performing differential absorption contrast enhancement on the set of projections, obtaining a second reconstructed volume dataset, and combining the first reconstructed volume dataset with the second reconstructed volume dataset to classify the particles;
• performing diffraction contrast tomography, obtaining a second reconstructed volume dataset, and combining the first reconstructed volume dataset with the second reconstructed volume dataset to classify the particles;
• or
• performing x-ray fluorescence to detect different elements to create elemental maps, and combining the maps with the first reconstructed volume dataset to classify the particles.