Ion detector and mass spectrometer each including multiple dynodes
AssigneeHamamatsu Photonics K.K.
InventorsHiroshi Kobayashi, Junichi Kondo
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Abstract
An ion detector includes a first dynode, a second dynode, a scintillator, a conductive layer, and a photomultiplier tube. The first dynode is configured to emit a charged particle in response to the incidence of the ion. The second dynode is configured to be given a negative potential and emit a secondary electron in response to incidence of the charged particle from the first dynode. The scintillator includes an electron incident surface arranged to receive the secondary electron from the second dynode, and is configured to convert the secondary electron into light. The conductive layer is disposed on the electron incident surface. The photomultiplier tube is configured to detect the light from the scintillator.
Claims21
An ion detector for detecting an incident ion, comprising:
- a first dynode configured to emit a charged particle in response to incidence of the ion;
- a second dynode configured to be given a negative potential and emit a secondary electron in response to incidence of the charged particle from the first dynode;
- a scintillator including an electron incident surface arranged to receive the secondary electron from the second dynode, and configured to convert the secondary electron into light;
- a conductive layer disposed on the electron incident surface;
- and
- a photomultiplier tube configured to detect the light from the scintillator.
An ion detector for detecting an incident ion, comprising:
- a first dynode configured to emit a charged particle in response to incidence of the ion;
- a second dynode configured to be given a negative potential and emit a secondary electron in response to incidence of the charged particle from the first dynode;
- and
- a diode including an electron incident surface arranged to receive the secondary electron from the second dynode, and configured to detect the incident secondary electron.
An ion detector for detecting an incident ion, comprising:
- a first dynode configured to emit a charged particle in response to incidence of the ion;
- a second dynode configured to be given a negative potential and emit a secondary electron in response to incidence of the charged particle from the first dynode;
- and
- a detection unit including an electron incident surface arranged to receive the secondary electron from the second dynode, and configured to detect the incident secondary electron.
Dependencies are inferred from the claim text.