Electrical stress protection circuit and electronic device including the same

An electronic device configured to perform a predetermined function, comprising:

• a detection circuit including a first transistor connected to a driving voltage rail and turned on when electrical stress is provided;
• an electrical stress protection circuit including a plurality of bypass transistors turned on in response to a signal output when the first transistor is turned on and configured to provide electrical stress to a reference voltage rail;
• and
• a buffer configured to receive and buffer a detection signal and output the buffered detection signal,
• wherein the plurality of bypass transistors are connected in any one of series and series-parallel manner,
• wherein the detection circuit further includes a second transistor connected to the reference voltage rail and turned on due to a breakdown when the electrical stress is provided,
• wherein a gate electrode of the second transistor is connected to the reference voltage rail through a gate protection resistor,
• wherein the buffer includes:
• a fourth transistor turned on in response to the detection signal;
• and
• a third transistor turned on in response to a signal output when the fourth transistor is turned on, and
• wherein a voltage that is higher than a voltage provided to the driving voltage rail is provided to a body electrode of the first transistor.