Method for manufacturing an antenna array, antenna array, and test system
AssigneeRohde & Schwarz GmbH & Co. KG
InventorBenoit Derat
Life of this patent
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Abstract
A method of manufacturing an antenna array is described. The method includes: providing several antennas; determining at least one set of quasi-random positions for the antennas based on a predefined algorithm for limiting aliasing effects, wherein the positions are arranged on a manifold having at least one dimension in an irregular manner; and arranging the antennas according to the at least one set of quasi-random positions obtained from the predefined algorithm for limiting aliasing effects. Further, an antenna array and a test system are described.
Claims13
A method of manufacturing an antenna array, comprising:
- providing several antennas;
- determining at least one set of quasi-random positions for the antennas based on a predefined algorithm for limiting aliasing effects, wherein the positions are arranged on a manifold having at least one dimension in an irregular manner;
- and
- arranging the antennas according to the at least one set of quasi-random positions obtained from the predefined algorithm for limiting aliasing effects,
- wherein several sets of quasi-random positions are determined based on the predefined algorithm for limiting aliasing effects, and wherein one of the several sets of quasi-random positions is selected based on at least one predefined criterion.
A test system, comprising:
- a device under test configured to transmit electromagnetic waves;
- an antenna array arranged in a near-field area of the device under test, the antenna array including a plurality of antennas arranged according to a set of quasi-random positions that reduces aliasing effects, the set of quasi-random positions being selected from several sets of quasi-random positions based on at least one predefined criterion, wherein the antenna array is configured to take a set of sample measurements of the electromagnetic waves transmitted by the device under test via the plurality of antennas of the antenna array;
- and
- an analysis circuit configured to determine at least one far-field quantity of the electromagnetic waves generated by the device under test based on the set of sample measurements.
Dependencies are inferred from the claim text.