Analyzing in-plane distortion
AssigneeApplied Materials, Inc.
InventorsWenjiao Wang, Joshua Maher, Xinhai Han, Deenesh Padhi, Tza-Jing Gung
Life of this patent
Estimating the term…
Loading patent…
AssigneeApplied Materials, Inc.
InventorsWenjiao Wang, Joshua Maher, Xinhai Han, Deenesh Padhi, Tza-Jing Gung
Estimating the term…
Methods, systems, and non-transitory computer readable medium are described for generating assessment maps for corrective action. A method includes receiving a first vector map including a first set of vectors each indicating a distortion of a particular location of a plurality of locations on a substrate. The method further includes generating a second vector map including a second set of vectors by rotating a position of each vector in the first set of vectors. The method further includes generating a third vector map including a third set of vectors based on vectors in the second set of vectors and corresponding vectors in the first set of vectors. The method further includes generating a fourth vector map by subtracting each vector of the third set of vectors from a corresponding vector in the first set of vectors. The fourth vector map indicates a planar component of the first vector map.
A system comprising:
A method comprising:
A non-transitory computer-readable storage medium comprising instructions that, when executed by a processing device operatively coupled to a memory, performs operations comprising:
Dependencies are inferred from the claim text.