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US 11,637,005 B2Granted
Methods and systems for quantifying two or more analytes using mass spectrometry
AssigneePerkinElmer U.S. LLC
InventorsSamad Bazargan, Hamid Badiei
Life of this patent
Estimating the term…
Abstract
Certain embodiments described herein are directed to methods and systems of detecting two or more analytes present in a single system such as a nanoparticle or nanostructure. In some examples, the methods and systems can estimate data gaps and fit intensity curves to obtained detection values so the amount of the two or more analytes present in the single system can be quantified.
Claims21
A mass spectrometer system configured to quantify an amount of a first analyte and an amount of a second analyte in a transient sample, the system comprising:
- an ionization source configured to generate an ion cloud comprising ions from the first analyte and ions from the second analyte;
- an interface fluidically coupled to the ionization source, the interface configured to sample the generated ion cloud;
- a collision-reaction cell fluidically coupled to the interface, the collision-reaction cell configured to receive the sampled, generated ion cloud and configured to receive a gas to pressurize the collision-reaction cell to broaden the sampled, generated ion cloud in the collision-reaction cell;
- a mass analyzer fluidically coupled to the collision-reaction cell and configured to receive the broadened ion cloud from the collision-reaction cell, the mass analyzer configured to alternately select ions from the first analyte and the ions from the second analyte;
- a detector configured to receive the alternately selected ions from the mass analyzer and detected received ions from the first analyte as first detection values during a detection period and to detect received provided ions from the second analyte as second detection values during the detection period;
- and
- a processor configured determine an amount of the first analyte in the transient sample using the first detection values and configured to determine an amount of the second analyte in the transient sample using the second detection values.
4 more elements
A mass spectrometer system configured to quantify an amount of a first analyte and an amount of a second analyte in a transient sample, the system comprising:
- an ionization source configured to generate an ion cloud comprising ions from the first analyte and ions from the second analyte;
- an interface fluidically coupled to the ionization source, the interface configured to sample the generated ion cloud;
- a collision-reaction cell fluidically coupled to the interface and configured to receive the sampled, generated ion cloud, wherein the collision-reaction cell comprises two or more axial electrodes configured to provide an axial field to broaden the sampled, generated ion cloud in the collision-reaction cell;
- a mass analyzer fluidically coupled to the collision-reaction cell and configured to receive the broadened ion cloud from the collision-reaction cell, the mass analyzer configured to alternately select ions from the first analyte and the ions from the second analyte;
- a detector configured to receive the alternately selected ions from the mass analyzer and detected received ions from the first analyte as first detection values during a detection period and to detect received provided ions from the second analyte as second detection values during the detection period;
- and
- a processor configured determine an amount of the first analyte in the transient sample using the first detection values and configured to determine an amount of the second analyte in the transient sample using the second detection values.
4 more elements
A mass spectrometer system configured to quantify an amount of a first analyte and an amount of a second analyte in a transient sample, the system comprising:
- an ionization source configured to generate an ion cloud comprising ions from the first analyte and ions from the second analyte;
- an interface fluidically coupled to the ionization source, the interface configured to sample the generated ion cloud and broaden the sampled ion cloud by adjusting a sampling depth between the interface and an ionization region of the ionization source;
- a mass analyzer fluidically coupled to the interface and configured to receive the broadened ion cloud from the interface, the mass analyzer configured to alternately select ions from the first analyte and the ions from the second analyte;
- a detector configured to receive the alternately selected ions from the mass analyzer and detected received ions from the first analyte as first detection values during a detection period and to detect received provided ions from the second analyte as second detection values during the detection period;
- and
- a processor configured determine an amount of the first analyte in the transient sample using the first detection values and configured to determine an amount of the second analyte in the transient sample using the second detection values.
3 more elements
Dependencies are inferred from the claim text.