Method of counting number of cells in nonvolatile memory device and nonvolatile memory device with cell counter performing the same
AssigneeSamsung Electronics Co., Ltd.
InventorsMinseok Kim, Hyunggon Kim
Life of this patent
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AssigneeSamsung Electronics Co., Ltd.
InventorsMinseok Kim, Hyunggon Kim
Estimating the term…
In a method of counting the number of memory cells in a nonvolatile memory device, a measurement range and a plurality of measurement intervals of a measurement window for a cell counting operation are set to a first range and a plurality of first intervals, respectively. The plurality of measurement intervals are included in the measurement range. A first sensing operation is performed on first memory cells included in a first region of a memory cell array based on the measurement window. A first shifting operation for shifting the measurement window is performed while a width of the measurement range and a width of each of the plurality of measurement intervals are maintained. A second sensing operation is performed on the first memory cells based on the measurement window shifted by the first shifting operation. A final count value for the first memory cells is obtained based on a result of the first sensing operation and a result of the second sensing operation.
A method of counting a number of memory cells in a memory cell array of a nonvolatile memory device, the method comprising:
A nonvolatile memory device comprising:
A method of counting a number of memory cells in a memory cell array of a nonvolatile memory device, the method comprising:
Dependencies are inferred from the claim text.