Three-dimensional geometry measurement apparatus and three-dimensional geometry measurement method

A three-dimensional geometry measurement apparatus comprising:

• a projection part that projects, onto an object to be measured, a projection image including patterns for identifying a projection coordinate;
• a first imaging part that generates a first captured image by imaging the projection image projected onto the object to be measured;
• a second imaging part that generates a second captured image by imaging the projection image projected onto the object to be measured;
• a first coordinate identification part that identifies the projection coordinate corresponding to a first imaging pixel of the first captured image on the basis of the patterns included in the first captured image;
• a second coordinate identification part that identifies the projection coordinate corresponding to a second imaging pixel of the second captured image on the basis of the patterns included in the second captured image;
• a line identification part that identifies an epipolar line of the projection image corresponding to the first imaging pixel on the basis of an arrangement of the first imaging part and the projection part, and identifies an epipolar line of the second captured image corresponding to the projection pixel of the projection image on the basis of an arrangement of the projection part and the second imaging part;
• a relationship identification part that identifies a combination of the first imaging pixel and a projection pixel of the projection image having the projection coordinate corresponding to the first imaging pixel and located on the epipolar line of the projection image corresponding to the first imaging pixel;
• a determination part that determines, for the combination of the first imaging pixel and the projection pixel, whether or not at least one of (i) the first imaging pixel, (ii) a main second imaging pixel which is an imaging pixel of the second captured image corresponding to the same projection coordinate as the projection coordinate corresponding to the first imaging pixel, or (iii) a sub second imaging pixel which is an imaging pixel of the second captured image corresponding to the projection coordinate of the projection pixel and located on the epipolar line of the second captured image corresponding to the projection pixel is a defective pixel on the basis of a distance between the main second imaging pixel and the sub second imaging pixel;
• and
• a geometry measurement part that measures a geometry of the object to be measured using at least one of the first imaging pixel, the main second imaging pixel or the sub second imaging pixel, for which no defective pixel is determined.