System and method to detect failures at a subset of load cells
AssigneeAmazon Technologies, Inc.
InventorPaul Eugene Munger
Life of this patent
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AssigneeAmazon Technologies, Inc.
InventorPaul Eugene Munger
Estimating the term…
Load cells are used in a fixture of a facility to acquire weight data. However, some of the load cells used in the fixture may fail. One way to test a subset of load cells is to compare data from a first subset of load cells to a second subset of load cells using a linear regression. For example, the linear regression may help determine predicted values for the first subset of load cells. Actual values from the first subset of load cells are then compared to the predicted values. If the differences between the actual values and predicted values for the first subset of load cells are greater than a threshold, a determination is made that the first subset of load cells has failed. Weight data from the second subset of load cells may then be used to determine hypotheses for describing interactions at the fixture.
A method comprising:
A system comprising:
A system comprising:
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