Temperature control circuit, memory storage device and temperature control method

A memory storage device, comprising:

• a connection interface unit, configured to couple to a host system;
• a rewritable non-volatile memory module;
• a memory control circuit unit;
• and
• a temperature control circuit, coupled to the connection interface unit, the rewritable non-volatile memory module and the memory control circuit unit,
• wherein the temperature control circuit is configured to detect a temperature of the memory storage device and generate first evaluation information,
• the temperature control circuit is further configured to detect a work status of at least one circuit module in the memory storage device and generate second evaluation information without referring to a detection result of the temperature, wherein the second evaluation information reflects whether the at least one circuit module is in a busy status, and
• the temperature control circuit is further configured to adjust at least one electronic parameter of the memory storage device according to the first evaluation information and the second evaluation information to control the temperature of the memory storage device.

A temperature control method for a memory storage device, and the temperature control method comprising:

• detecting a temperature of the memory storage device and generating first evaluation information;
• detecting a work status of at least one circuit module in the memory storage device and generating second evaluation information without referring to a detection result of the temperature, wherein the second evaluation information reflects whether the at least one circuit module is in a busy status;
• and
• adjusting at least one electronic parameter of the memory storage device according to the first evaluation information and the second evaluation information to control the temperature of the memory storage device.