Positive resist composition and patterning process
AssigneeShin-Etsu Chemical Co., Ltd.
InventorsJun Hatakeyama, Masaki Ohashi, Takayuki Fujiwara
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Abstract
A positive resist composition comprising a base polymer comprising recurring units (a) having the structure of an ammonium salt of fluorosulfonic acid having an iodized or brominated aromatic ring, and recurring units (b1) having an acid labile group-substituted carboxyl group and/or recurring units (b2) having an acid labile group-substituted phenolic hydroxyl group exhibits a high sensitivity, high resolution, low edge roughness and dimensional uniformity, and forms a pattern of good profile after exposure and development.
Claims10
A positive resist composition comprising a base polymer comprising recurring units (a) having the structure of an ammonium salt of fluorosulfonic acid having an iodine or bromine-substituted aromatic ring, and recurring units of at least one type selected from recurring units (b1) having a carboxyl group substituted with an acid labile group and recurring units (b2) having a phenolic hydroxyl group substituted with an acid labile group, wherein the recurring units (a) have the formula (a):
- wherein RA is hydrogen or methyl,
- X1A is a single bond, ester bond or amide bond,
- X1B is a single bond or a C1-C20 di- or trivalent hydrocarbon group which may contain an ether bond, carbonyl moiety, ester bond, amide bond, sultone moiety, lactam moiety, carbonate moiety, halogen, hydroxyl moiety or carboxyl moiety,
- R1, R2 and R3 are each independently hydrogen, a C1-C12 straight or branched alkyl group, C2-C12 straight or branched alkenyl group, C6-C12 aryl group, or C7-C12 aralkyl group, R1 and R2, or R1 and X1B may bond together to form a ring with the nitrogen atom to which they are attached, the ring may contain oxygen, sulfur, nitrogen or a double bond,
- R4 is a hydroxyl group, carboxyl group, fluorine, chlorine, bromine, amino group, or a C1-C20 alkyl group, C1-C20 alkoxy group, C2-C20 alkoxycarbonyl group, C2-C20 acyloxy group, or C1-C20 alkylsulfonyloxy group, which may contain fluorine, chlorine, bromine, hydroxyl, amino, or C1-C10 alkoxy moiety, or —NR4A—C(═O)—R4B, or —NR4A—C(═O)—O—R4B, R4A is hydrogen or a C1-C6 alkyl group which may contain halogen, hydroxyl, C1-C6 alkoxy moiety, C2-C6 acyl moiety or C2-C6 acyloxy moiety, R4B is a C1-C16alkyl group, C2-C16 alkenyl group or C6-C12 aryl group, which may contain halogen, hydroxyl, C1-C6 alkoxy moiety, C2-C6 acyl moiety or C2-C6 acyloxy moiety, R4 may be the same or different when n and/or q is 2 or 3,
- Rf1 to Rf4 are each independently hydrogen, fluorine or trifluoromethyl, at least one of Rf1 to Rf4 being fluorine or trifluoromethyl, Rf1 and Rf2, taken together, may form a carbonyl group,
- XBI is iodine or bromine, XBI may be the same or different when m and/or q is 2 or more,
- L1 is a single bond, ether bond, ester bond, or a C1-C6 alkanediyl group which may contain an ether bond or ester bond,
- L2 is a single bond or a C1-C20 divalent linking group when q=1, or a C1-C20 (q+1)-valent linking linking group when q=2 or 3, the linking group may contain oxygen, sulfur or nitrogen,
- m is an integer of 1 to 5, n is an integer of 0 to 3, 1≤m+n≤5, p is 1 or 2, and q is an integer of 1 to 3.
Dependencies are inferred from the claim text.