Microspectroscope having position correction function

A microspectroscope comprising:

• a light source that emits an excitation light to a sample in which a sample point that is a target of spectrometry is recorded;
• a condensing lens that emits the excitation light to a predetermined position of the sample and condenses a reflected light or a transmitted light from the sample, the condensing lens having a low magnification objective lens and a high magnification objective lens;
• a spectrometer that detects a condensed light;
• and an analysis control unit for analyzing a signal from the spectrometer;
• the microspectroscope that uses an observation image of the sample to perform spectrometry,
• wherein
• the analysis control unit comprises:
• an image storage part configured to:
• obtain a plurality of sample images with regard to the sample, the plurality of sample images having different focal points each other, the plurality of sample images being captured using the low magnification objective lens while changing a distance between the low magnification objective lens and the sample in a first direction along the excitation light and not changing a positional relationship between the low magnification objective lens and the sample in a second direction perpendicular to the first direction;
• and
• obtain an all-in-focus image by synthesizing areas in focus in the plurality of the sample images to store the all-in-focus image;
• and
• a control part configured to:
• switch to the high magnification lens;
• calculate a deviation amount between the sample point in the all-in-focus image and the sample point in a high magnification image;
• perform centering correction by position correction to a position deviation of the sample;
• and
• perform spectrometry for the sample point using the high magnification lens.