Parameter adjustment device, training device, and measurement system
AssigneeMitsubishi Electric Corporation
InventorsDaiki Ata, Satoshi Namematsu
Life of this patent
Estimating the term…
Loading patent…
AssigneeMitsubishi Electric Corporation
InventorsDaiki Ata, Satoshi Namematsu
Estimating the term…
A parameter adjustment device (500) adjusts a parameter relating to control of laser light emitted from a measurement sensor (210) onto an object. A parameter calculator (520) calculates the parameter by applying, to a trained model generated through machine learning using training data sets each including waveform data of an amount of light received by the measurement sensor (210) and data indicating the parameter used to acquire the waveform data, waveform data newly acquired in a new state. The parameter calculated by the parameter calculator (520) enables measurement of the object using the measurement sensor (210) in the new state. A parameter outputter (530) outputs data indicating the parameter calculated by the parameter calculator (520).
A parameter adjustment device for adjusting a parameter relating to control of laser light emitted from a measurement sensor onto an object, the parameter adjustment device comprising:
A training device comprising:
A measurement system comprising:
Dependencies are inferred from the claim text.