Memory temperature controlling method and memory temperature controlling system

A memory temperature controlling method, adapted for a memory storage device, the memory storage device comprising a memory control circuit unit and a rewritable non-volatile memory module, the rewritable non-volatile memory module comprising a plurality of memory packages, and the method comprising:

• performing, by a testing equipment, a plurality of test modes on the memory storage device, and obtaining a first internal temperature of the memory control circuit unit, a second internal temperature of each of the memory packages and a surface temperature of each of the memory packages to establish a linear relationship expression of the first internal temperature, the second internal temperature and the surface temperature;
• storing, by the testing equipment, the linear relationship expression in the memory storage device;
• using, by the memory storage device, the linear relationship expression to calculate a predicted surface temperature of the rewritable non-volatile memory module based on a first current internal temperature of the memory control circuit unit and a second current internal temperature of each of the memory packages;
• and
• adjusting, by the memory storage device, an operating frequency for accessing the rewritable non-volatile memory module based on the predicted surface temperature.