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US 11,635,457 B2Granted
Apparatus and method for performing time domain reflectormetry
AssigneeRohde & Schwarz GmbH & Co. KG
InventorsJulian Schmid, Reiner Hausdorf, Josef Breher
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Abstract
A time domain reflectometry measurement apparatus and method is provided. Measurement data of a time domain reflectometry measurement are analyzed with respect to previously acquired empirical measurement data of error-free or faulty devices with known failures. In this way, failures can be identified in the device under test without the need of opening the device.
Claims20
An apparatus for performing time domain reflectometry, the apparatus comprising:
- a measurement device for executing a time domain reflectometry measurement on a device under test, wherein a measurement terminal of the measurement device is connected to the device under test by a conductive radio frequency connection, and wherein the device under test is configured to receive radio frequency signals;
- an analysis memory for providing a number of device patterns of the device under test;
- and
- a control device, comprising:
- a processing unit for obtaining a measurement profile of the device under test, the measurement profile comprising a specification of components included in the device under test,
- a data interface for obtaining the device patterns from the analysis memory, wherein the data interface obtains device patterns relating to components of the device under test according to the obtained measurement profile,
- a measurement interface for receiving a measurement result of a time domain reflectometry measurement from the measurement device,
- wherein the processing unit is configured to identify a position of failure within the device under test by comparing the received measurement result with the obtained device patterns relating to components of the device under test.
5 more elements
A method for performing time domain reflectometry, the method comprising:
- obtaining a measurement profile of the device under test, the measurement profile comprising a specification of components included in the device under test,
- executing a time domain reflectometry measurement on the device under test by a measurement device, wherein a measurement terminal of the measurement device is connected to the device under test by a conductive radio frequency connection, and wherein the device under test is configured to receive radio frequency signals;
- receiving device patterns from the analysis memory, wherein the device patterns relate to components of the device under test according to the obtained measurement profile;
- identifying a position of failure within the device under test by comparing a measurement result of the time domain reflectometry measurement on a device under test with the received device patterns relating to components of the device under test.
1 more element
Dependencies are inferred from the claim text.