Workpiece holder for utilization in metrology system for measuring workpiece in different orientations
AssigneeMitutoyo Corporation
InventorsScott Allen Harsila, Maxwell James Perkins
Life of this patent
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AssigneeMitutoyo Corporation
InventorsScott Allen Harsila, Maxwell James Perkins
Estimating the term…
A workpiece holder is configured to hold a workpiece and is utilized in a metrology system which includes a sensing configuration for obtaining 3-dimensional surface data for the workpiece. The workpiece holder includes at least three reference features (e.g., spherical reference features extending from sides) that are configured to be sensed by the sensing configuration when the workpiece holder is in different orientations (e.g., as rotated 180 degrees between first and second orientations for presenting front and back sides of the workpiece towards the sensing configuration). A determination of 3-dimensional positions of the reference features for each orientation enables a combining (e.g., in a common coordinate system) of 3-dimensional surface data that is acquired for the workpiece in each orientation. Interchangeable workpiece holding portions may be provided that fit within the workpiece holder for holding workpieces with different characteristics (e.g., having different sizes and/or shapes).
A metrology system, comprising:
A computer-implemented method for operating a metrology system including a sensing configuration for obtaining 3-dimensional surface data for a workpiece that is held in a workpiece holder, the computer-implemented method comprising:
A workpiece holding configuration for utilization in a metrology system which includes a sensing configuration that is utilized for obtaining 3-dimensional surface data for a workpiece, the workpiece holding configuration comprising:
Dependencies are inferred from the claim text.