Dynamically re-configurable in-field self-test capability for automotive systems
AssigneeQUALCOMM Incorporated
InventorsKiran Kumar Malipeddi, Rahul Gulati
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Abstract
Various embodiments include components (e.g., a processor in a vehicle advanced driver assistance system) configured to identify subsystems that require testing in order to verify their compliance with a safety requirement. The components may determine whether verification of compliance requires that the subsystems be tested at PON, at POFF, during runtime or a combination thereof, dynamically determine the achievable parallelism for testing the identified subsystems, dynamically determine coverage level requirements for performing or executing built in self tests (BISTs) on each identified subsystem, and perform or execute the BISTs on the subsystems at the determined level of parallel and at the determined coverage level.
Claims8
A computing device, comprising:
- a primary boot processor configured with processor-executable software instructions to:
- receive a list of subsystems that are associated with a safety critical automotive application of a vehicle;
- determine, for each subsystem in the received list of subsystems, whether verification of compliance with a safety requirement requires that the subsystem be tested at power-on (PON), at power-off (POFF), or during runtime;
- dynamically determine, for each subsystem in the received list of subsystems, a coverage level required for performing a built in self test (BIST) on that subsystem;
- and
- perform BISTs on the subsystems at the determined coverage level at PON, POFF or runtime to verify compliance with the safety requirement.
Dependencies are inferred from the claim text.