Grain-oriented electrical steel sheet, annealing separator, and method for manufacturing grain-oriented electrical steel sheet

A grain-oriented electrical steel sheet comprising

• a base steel sheet having a chemical composition comprising, by mass %,
• C:
• 0.0050% or less,
• Si:
• 2.5 to 4.5%,
• Mn:
• 0.02 to 0.20%,
• one or more elements selected from the group comprised of S and Se:
• total of 0.005% or less,
• sol. Al:
• 0.004% or less, and
• N:
• 0.010% or less and
• having a balance comprised of Fe and impurities and
• a primary coating formed on a surface of the base steel sheet and comprising 50 to 95% by mass of Mg2SiO4 as a constituent, where,
• in a correlation distribution chart, which represents a correlation of a characteristic X-ray intensity and a surface height of the primary coating from a surface of the primary coating opposite to the base steel sheet obtained by projecting the surface height of the primary coating and constituent information in the primary coating on a plane having an area of 20 μm×15 μm parallel to a base steel sheet side, wherein a direction from a primary coating side toward the base steel sheet in a thickness direction of the base steel sheet is defined as positive,
• when designating a center value of the surface height of the primary coating as H0, designating the primary coating existing at the height of H0+0.2 μm or more on the base steel sheet side as an “anchoring oxide layer region”, and designating the primary coating existing at the height of less than H0+0.2 μm on the primary coating side as a “surface oxide layer region”,
• identifying a maximum value of the characteristic X-ray intensity of Al, and designating a region in which a characteristic X-ray intensity of Al is 20% or more of the maximum value of the Al as an “Al concentrated region”,
• the primary coating satisfies the conditions of
• (1) number density D3 of Al concentrated regions:
• 0.020 to 0.180/μm2,
• (2) (total area S5 of Al concentrated regions in anchoring oxide layer regions)/(total area S3 of Al concentrated regions)≥33%,
• (3) distance H5 subtracting H0 from mean value of height of regions which is anchoring oxide layer regions and is also Al concentrated regions in thickness direction:
• 0.4 to 4.0 μm, and
• (4) (total area S1 of anchoring oxide layer regions)/(observed area S0)≥15%.