Method for rapid development of additive manufacturing parameter set
AssigneesCarl Zeiss Industrial Metrology, LLC, UT-Battelle, LLC
InventorsPradeep Bhattad, Paul Brackman, Curtis Frederick, Marcin B. Bauza, Edson Costa Santos, Ryan Dehoff, Alex Plotkowski, Aleksandr Lisovich, Jason James Tenboer
Life of this patent
Estimating the term…