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US 11,630,150 B2Granted
IC device authentication using energy characterization
AssigneeScience Applications International Corporation
InventorDavid Michael Barrett
Life of this patent
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Abstract
Systems, methods, and apparatuses are described for verifying the authenticity of an integrated circuit device. An integrated test apparatus may use quiescent current and/or conducted electromagnetic interference readings to determine if a device under test matches the characteristics of an authenticated device. Deviations from the characteristics of the authenticated device may be indicative of a counterfeit device.
Claims20
A method comprising:
- receiving a first quiescent current (QC) from a device while the device is subject to a first voltage;
- receiving a second QC from the device while the device is subject to a second voltage;
- determining one or more variability values, comprising one or more r-squared values, based at least in part on:
- a comparison of the first QC and an expected QC associated with the first voltage, and
- a comparison of the second QC and an expected QC associated with the second voltage;
- and
- determining, based at least in part on the one or more variability values, that a threshold is not satisfied.
4 more elements
A method comprising:
- applying, while a direct-current voltage is applied to a first device, an excitation signal to an input of the first device;
- detecting, based on the applied direct-current voltage and the applied excitation signal, a tested conducted electromagnetic interference (EMI) value of the first device based on a high frequency signal on a Vcc connection of the first device;
- and
- determining, based on a difference between the tested conducted EMI value and an expected conducted EMI value, that a threshold is not satisfied, wherein the expected conducted EMI value is associated with a second device.
1 more element
A method comprising:
- determining, based on separate applications of a plurality of different voltages to a first circuit, one or more variability values;
- determining, based on comparing the one or more variability values with one or more expected values, that a first threshold is not satisfied;
- determining a tested conducted electromagnetic interference (EMI) value for the first circuit based on high frequency feedback, on a Vcc connection of the first circuit, from an applied excitation signal;
- and
- determining, based on a difference between the tested conducted EMI value and an expected conducted EMI value, that a second threshold is not satisfied.
2 more elements
Dependencies are inferred from the claim text.