Vector network analyzer with digital interface
AssigneeRohde & Schwarz GmbH & Co. KG
InventorsSteffen Heuel, Steffen Neidhardt, Thilo Bednorz
Life of this patent
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Abstract
A vector network analyzer is provided which includes a first measuring port, a digital interface connected to the first measuring port, a second measuring port adapted to be connected to a radio frequency (RF) input or output of a device under test (DUT), and a processor. The digital interface is adapted to be connected to a digital input or output of the DUT. The processor is adapted to determine scattering parameters (S-parameters) of the DUT based on measuring signals transmitted to the DUT and received from the DUT by the first measuring port and the second measuring port.
Claims14
A measuring device, comprising:
- a first measuring port;
- a digital interface connected to the first measuring port, wherein the digital interface is adapted to be connected to a digital input or output of a device under test (DUT);
- a second measuring port adapted to be connected to a radio frequency (RF) input or output of the DUT;
- and
- a processor adapted to determine scattering parameters (S-parameters) of the DUT based on measuring signals transmitted to the DUT and received from the DUT by the first measuring port and the second measuring port;
- and
- wherein the digital interface is connected to the digital input of the DUT, and the second measuring port is connected to the RF output of the DUT,
- wherein the first measuring port is adapted to generate a first analog measuring signal and to provide the first analog measuring signal to the digital interface,
- wherein the digital interface is adapted to generate a digital measuring signal based on the first analog measuring signal, and to provide the digital measuring signal to the digital input of the DUT,
- wherein the second measuring port is adapted to receive a second analog measuring signal generated by the DUT based on the digital measuring signal and output by the RF output of the DUT, and
- wherein the processor is adapted to determine the S-parameters of the DUT based on the first analog measuring signal and the second analog measuring signal.
A method for measuring scattering parameters (S-parameters) of a device under test (DUT), comprising:
- generating, by a first measuring port of a measuring device, a first analog measuring signal, and providing the first analog measuring signal to a digital interface of the measuring device;
- generating, by the digital interface of the measuring device, a digital measuring signal based on the first analog measuring signal, and providing the digital measuring signal to a digital input of the DUT;
- receiving, by a second measuring port of the measuring device, a second analog measuring signal generated by the DUT based on the digital measuring signal and output by an RF output of the DUT;
- and
- determining, by a processor of the measuring device, the S-parameters of the DUT based on the first analog measuring signal and the second analog measuring signal.
A method for measuring scattering parameters (S-parameters) of a device under test (DUT), comprising:
- generating, by a first measuring port of a measuring device, a first analog measuring signal, and providing the first analog measuring signal to an optical interface of the measuring device via a coupler;
- generating, by the optical interface of the measuring device, an optical measuring signal based on the first analog measuring signal, and providing the optical measuring signal to an optical input of the DUT;
- receiving, by a second measuring port of the measuring device, a second analog measuring signal generated by the DUT based on the optical measuring signal and output by a radio frequency output of the DUT;
- determining, by a processor of the measuring device, the S-parameters of the DUT based on the first analog measuring signal and the second analog measuring signal.
Dependencies are inferred from the claim text.