Probe pin

A probe pin comprising a first plunger configured to come in contact with a testing target contact point of a testing object and a second plunger configured to come in contact with a testing contact point of a testing circuit,

• wherein the first plunger or the second plunger has:
• a stem;
• and
• a contact portion extending from the stem such that a cross-sectional area decreases, and having first and second tips, which are configured to come in contact with the testing target contact point or the testing contact point, at a front end,
• wherein the first and second tips are formed in symmetric shapes at positions that are symmetric with a central axis of the stem therebetween,
• wherein the contact portion has a first to fourth inclined surfaces inclined from each of the first and second tips such that the first and second tips form apexes of square-base pyramids,
• wherein a pair of the first inclined surfaces is formed to face each other with the central axis therebetween to extend to a boundary line perpendicular to the central axis from the first and second tips,
• wherein a pair of the second inclined surfaces is formed in contact with a circular circumferential surface of the contact portion at an opposite side of the first inclined surfaces with the first and second tips therebetween, and
• wherein pairs of third and fourth inclined surfaces are each symmetrically formed at both sides with the first and second tips therebetween to come in contact with the first and second inclined surfaces, respectively.