Clipped testing device having a flexible conducting member

A clipped testing device, comprising:

• a first clamping member, having a first substrate and a first pin joint member;
• a second clamping member, having a second substrate and a second pin joint member;
• a shaft, detachably pivoted to the first pin joint member and the second pin joint member;
• and
• a conducting member, disposed on the first clamping member and located between the first substrate and the second substrate, the conducting member having a first bent portion and a second bent portion, the first bent portion having a bottom surface, the second bent portion having a top surface, the bottom surface and the top surface having a predetermined distance therebetween;
• wherein the second bent portion has a first scraping structure,
• wherein when the distance between the bottom surface and the top surface is smaller than the predetermined distance, the first scraping structure moves closer to the first substrate.

A clipped testing device, comprising:

• a first clamping member, having a first substrate and a first pin joint member;
• a second clamping member, having a second substrate and a second pin joint member;
• a shaft, detachably pivoted to the first pin joint member and the second pin joint member;
• a conducting member, disposed on the first clamping member and located between the first substrate and the second substrate, the conducting member having an upper surface and a lower surface, the lower surface of the conducting member facing toward the first substrate, at least portion of the conducting member being wavy-shaped and having a first scraping structure on the upper surface;
• and
• a measuring member, disposed between the first substrate and the second substrate, at least portion of the measuring member is wavy-shaped and has a second scraping structure thereon.