System and method for viewing a subject

A method of generating a display for viewing a subject in a view through an eyepiece of a microscope, comprising:

• determining a first pose of a viewing plane viewed through the eyepiece relative to the subject;
• acquiring a first image of the subject at the viewing plane at the first pose at a first time;
• storing the first image;
• displaying the first image in the view plane superimposed on a live image of the subject;
• comparing the live image at a second time to the first image after moving a head of the microscope from and returning the head to the viewing plane at the first pose;
• determining whether a change in position of the live image relative to the first image has occurred between the first time and the third time;
• and
• outputting the determination.

A method of illustrating movement in a view through an eyepiece of a viewing system, comprising:

• identifying a landmark on a subject in a viewing plane of the eyepiece at a first time;
• identifying the landmark on the subject in the viewing plane of the eyepiece at a second time after the first time;
• evaluating whether a change has occurred in the landmark between the first time and the second time;
• and
• outputting a determination of the evaluation of whether a change in pose has occurred including superimposing a graphical representation indicating an amount of movement that has occurred between the first time and the second time.

A method of illustrating movement in a view through an eyepiece of a viewing system, comprising:

• identifying a landmark on a subject in a viewing plane of the eyepiece at a first time;
• identifying the landmark on the subject in the viewing plane of the eyepiece at a second time after the first time;
• evaluating whether a change has occurred in the landmark between the first time and the second time;
• and
• wherein the landmark is a first landmark, further comprising:
• identifying a second landmark relative to the first landmark, wherein the second landmark is on a non-rigid portion of the subject;
• determining a first pose of the first landmark relative to the second landmark at a first time;
• determining a second pose of the first landmark relative to the second landmark at a second time;
• evaluating whether a change in pose has occurred between the first landmark and the second landmark between the first time and the second time;
• outputting a determination of the evaluation of whether a change in pose has occurred.

A system for determining a pose of a microscope relative to a subject, comprising:

• a first emitter configured to be connected with the microscope;
• a first receiver configured to be connected with the microscope;
• a second emitter configured to be associated with the microscope;
• a second received configured to be associated with the microscope;
• and
• a processor system configured to communicate with both the first emitter and the first receiver;
• wherein the first emitter is configured to emit a first signal that is reflected from the subject and received by the first receiver;
• wherein the processor system is configured to execute instructions to determine a pose of a first portion of the subject based on the first emitter and received first signal;
• wherein the processor system is further configured to communicate with both the second emitter and the second receiver;
• wherein the second emitter is configured to emit a second signal that is reflected from the subject and received by the second receiver;
• wherein the processor system is configured to execute further instructions to determine the pose of a second portion of the subject based on the second emitter and received second signal.