Semiconductor optical element, semiconductor optical integrated element, and method for manufacturing semiconductor optical element
AssigneeMitsubishi Electric Corporation
InventorsTsutomu Yamaguchi, Hitoshi Sakuma, Kazuyuki Onoe
Life of this patent
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Abstract
A semiconductor optical element includes a first cladding layer; a second cladding layer formed in a ridge shape; and optical confinement layer interposed between the first cladding layer and the second cladding layer to propagate light, wherein the second cladding layer is configured with a ridge bottom layer; a ridge intermediate layer; and a ridge top layer in this order from the optical confinement layer, and the ridge intermediate layer is formed wider in cross section perpendicular to the optical axis—the light propagating direction in optical confinement layer—than the ridge bottom layer and the ridge top layer.
Claims14
A semiconductor optical element comprising:
- a first cladding layer;
- a second cladding layer having a ridge formed in a ridge shape;
- an optical confinement layer interposed between the first cladding layer and the second cladding layer and adapted to propagate light, wherein
- the ridge is configured with a ridge bottom layer, a ridge intermediate layer, and a ridge top layer in this order from the optical confinement layer, a contact layer is provided on the ridge top layer, the ridge intermediate layer is formed wider in cross section perpendicular to an optical axis, which is a light propagating direction in the optical confinement layer, than the ridge bottom layer and the ridge top layer,
- a thickness of the ridge bottom layer is in a range of 10% to 15% of a thickness of the ridge, and
- a lowermost layer of the ridge formed in a ridge shape is the ridge bottom layer.
A method of manufacturing a semiconductor optical element including a first cladding layer, a second cladding layer having a ridge formed in a ridge shape, an optical confinement layer interposed between the first cladding layer and the second cladding layer and adapted to propagate light, wherein the ridge is configured with a ridge bottom layer, a ridge intermediate layer, and a ridge top layer in this order from the optical confinement layer, ridge intermediate layer is formed wider in cross section perpendicular to an optical axis, which is a light propagating direction in the optical confinement layer, than the ridge bottom layer and the ridge top layer, and a thickness of the ridge bottom layer is in a range of 10% to 15% of a thickness of the ridge, the method comprising:
- growing a material for the optical confinement layer to form a first semiconductor layer on one surface of a semiconductor substrate serving as the first cladding layer, growing a material for the ridge bottom layer to form a second semiconductor layer, and then growing a material for the ridge intermediate layer to form a third semiconductor layer, growing a material for the ridge top layer to form a fourth semiconductor layer in this order from the semiconductor substrate;
- etching the fourth semiconductor layer to form the ridge top layer;
- and
- after etching the fourth semiconductor layer, etching the third semiconductor layer to have a width of the ridge intermediate layer, and
- after etching the third semiconductor layer, etching the second semiconductor layer to have a width of the ridge bottom layer.
Dependencies are inferred from the claim text.