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US 11,615,733 B2Granted
Pixel diagnostics with a bypass mode
AssigneeLumileds LLC
InventorRonald Johannes Bonne
Life of this patent
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Abstract
A LED controller includes an image buffer to hold image data. An LED pixel forming a part of a large pixel array is activatable in response to image data, LDO state, and pulse width modulation module state. A logic module including a pixel diagnostic mode using an LDO bypass is connected to modify LDO state and allow direct addressing of the LED pixel for diagnostic purposes without needing to use image data from the image buffer.
Claims18
A compound metal oxide semiconductor (CMOS) backplane comprising:
- a light emitting diode (LED) controller configured to be coupled with an LED pixel array, the LED controller comprising a plurality of switches configured to drive individually selected pixels of the LED pixel array;
- and
- a forward bias bus configured to be coupled with the LED pixel array such that the forward bias bus is shared by all of the pixels of the LED pixel array,
- the LED controller configured to, for each individually selected pixel during at least one of procedures including diagnostics, calibration, and testing of the LED pixel array:
- detect a forward bias voltage carried by the forward bias bus as either one of voltage detection including a normal forward bias voltage and a deviation from the normal forward bias voltage,
- in response to detection of the normal forward bias voltage, determine that the individually selected pixel is working correctly, and
- in response to detection of the deviation of a from the normal forward bias voltage, determine that a fault situation has occurred in the individually selected pixel.
4 more elements
A light emitting diode (LED) system comprising:
- an LED pixel array comprising pixels;
- and
- a compound metal oxide semiconductor (CMOS) backplane including:
- a light emitting diode (LED) controller configured to be coupled with the LED pixel array, the LED controller having a plurality of switches configured to drive pixels of the LED pixel array during at least one of procedures including diagnostics, calibration, and testing of the LED pixel array;
- and
- a forward bias bus configured to be coupled with the LED pixel array such that the forward bias bus is shared by all of the pixels of the LED pixel array,
- the LED controller configured to, for each individually selected pixel or group of pixels during the at least one of the procedures:
- detect a forward bias voltage carried by the forward bias bus as either one of voltage detection including a normal forward bias voltage and a deviation from the normal forward bias voltage,
- in response to detection of the normal forward bias voltage, determine that the individually selected pixel or group of pixels is working correctly, and
- in response to detection of the deviation of a from the normal forward bias voltage, determine that a fault situation has occurred in the individually selected pixel or group of pixels.
7 more elements
A method of testing a light emitting diode (LED) array, the method comprising:
- driving at least one of an individually selected pixel or group of pixels of the LED pixel array;
- detecting, when the at least one of the individually selected pixel or group of pixels is driven during at least one of procedures including diagnostics, calibration, and testing of the LED pixel array, a forward bias voltage carried by a forward bias bus connected with the LED pixel array as either one of voltage detection including a normal forward bias voltage and a deviation from the normal forward bias voltage;
- in response to detection of the normal forward bias voltage, determine that the individually selected pixel or group of pixels is working correctly, and
- in response to detection of the deviation of from the normal forward bias voltage, determine that a fault situation has occurred in the individually selected pixel or group of pixels.
1 more element
Dependencies are inferred from the claim text.