Semiconductor device and potential measurement apparatus
AssigneeSony Semiconductor Solutions Corporation
InventorYuri Kato
Life of this patent
Estimating the term…
Abstract
To provide a semiconductor device that makes it possible to reduce a cell circuit area and an increase in resolution. There is provided a semiconductor device including: a first region in which readout cells are arranged in an array form, the readout cells having one of input transistors included in a differential amplifier: and a second region in which reference cells are arranged in an array form, the reference cells having another input transistor included in the differential amplifier, the first region and the second region being separated from each other.
Claims18
A semiconductor device, comprising:
- a first region in which readout cells are arranged in an array form, the readout cells having one input transistor included in a differential amplifier;
- and
- a second region in which reference cells are arranged in an array form, the reference cells having another input transistor included in the differential amplifier,
- wherein the second region includes two portions, a first portion provided on a first side of the first region and a second portion provided on a second side of the first region,
- wherein the first portion of the second region and the second portion of the second region are provided on opposite sides of the first region,
- wherein a plurality of output signal lines from the differential amplifier are provided in parallel, and a plurality of the differential amplifiers are simultaneously turned to an operation state to simultaneously read outputs from the plurality of the differential amplifiers.
A potential measurement apparatus, comprising:
- a semiconductor device, comprising:
- a first region in which readout cells are arranged in an array form, the readout cells having one input transistor included in a differential amplifier;
- and
- a second region in which reference cells are arranged in an array form, the reference cells having another input transistor included in the differential amplifier;
- a horizontal selection circuit that selects a readout cell and a reference cell of semiconductor device;
- and
- an A/D conversion circuit that converts an analog signal outputted from the semiconductor device into a digital signal,
- wherein the A/D conversion circuit includes a comparator circuit that compares a predetermined reference potential with an output from the semiconductor device, and
- wherein the comparator circuit includes an amplifier in a first stage, an amplifier in a second stage, and a Miller capacitance coupled between the amplifier in the first stage and the amplifier in the second stage.
Dependencies are inferred from the claim text.