Modular test and measurement device

A method for providing a modular test instrument, comprising:

• providing a modular display unit comprising a display element, a display face to present the display element, and a display connector face to connect to other modular units;
• providing a modular processing unit comprising a processor, a memory, a processing unit interface, a first processing unit connector face, and a second processing unit connector face;
• providing a modular test unit comprising a test unit connector face to be connectable to at least one of the modular display unit or the modular processing unit,
• wherein the display connector face of the modular display unit comprises at least one coupling mechanism to enable connectivity and integration with one of the first processing unit connector face of the modular processing unit or the test unit connector face of the modular test unit, the at least one coupling mechanism comprising at least one of a mechanical coupler, electrical coupler, or magnetic coupler;
• and
• providing an additional modular test subunit comprising an additional test unit interface, a first additional test unit connector face, and a second additional test unit connector face,
• wherein the first additional test unit connector face is to be coupled to one of the second processing unit connector face of the modular processing unit or the test unit connector face of the modular test unit.

A test instrument, comprising:

• a modular display unit comprising a display element, a display face to present the display element, and a display connector face to connect to other modular units;
• a modular processing unit comprising a processor, a memory, a processing unit interface, a first processing unit connector face, and a second processing unit connector face;
• and
• at least one of a modular test unit or a modular test subunit configured to be connectable to at least one of the modular display unit or the modular processing unit, wherein:
• the modular test unit comprises:
• a test unit interface;
• a first test unit connector face;
• and
• a second test unit connector face;
• and
• the modular test subunit comprises:
• a test subunit interface;
• a first test subunit connector face;
• and
• a second test subunit connector face;
• wherein the second processing unit connector face of the modular processing unit is communicatively coupled to at least the first test unit connector face of the modular test unit or the first test subunit connector face of the modular test subunit;
• and
• wherein the display connector face of the modular display unit comprises at least one coupling mechanism to enable connectivity and integration with at least one of the first processing unit connector face of the modular processing unit or the first test unit connector face of the modular test unit, the at least one coupling mechanism comprising at least one of a mechanical coupler, electrical coupler, or magnetic coupler.