Method for measuring power of non-constant envelope modulated signal, and electronic device
AssigneeGeneral Test Systems Inc.
InventorsJun Li, Wei Yu, Yihong Qi
Life of this patent
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AssigneeGeneral Test Systems Inc.
InventorsJun Li, Wei Yu, Yihong Qi
Estimating the term…
The disclosure provides a method for measuring a power of a non-constant envelope modulated signal, an electronic device, and a computer readable storage medium. The method includes: sampling baseband I/Q data transmitted by a device under test to obtain sample data, in which a sampling duration is less than a length of a cycle of the non-constant envelope modulated signal; calculating a sample power within the sampling duration based on the sample data; matching in predetermined baseband I/Q data in the cycle based on the sample data to obtain a target baseband I/Q data segment; obtaining a power calibration value corresponding to the target baseband I/Q data segment; and obtaining an actual power of the non-constant envelope modulated signal in the cycle based on the power calibration value corresponding to the target baseband I/Q data segment and the sample power within the sampling duration.
A method for measuring a power of a non-constant envelope modulated signal, the method comprising:
A method for measuring a power of a non-constant envelope modulated signal, the method comprising:
An electronic device comprising:
Dependencies are inferred from the claim text.