Dielectric fins with air gap and backside self-aligned contact
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsKo-Cheng Liu, Ming-Shuan Li, Ming-Lung Cheng, Chang-Miao Liu
Life of this patent
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Abstract
A method includes providing a structure having two fins extending from a substrate and an isolation structure adjacent to lower portions of the fins; forming a cladding layer over the isolation structure and over top and sidewalls of the fins; recessing the isolation structure using the cladding layer as an etch mask to expose the substrate; after the recessing of the isolation structure, depositing a seal layer over the substrate, the isolation structure, and the cladding layer; forming a sacrificial plug over the seal layer and between the two fins; and depositing a dielectric top cover over the sacrificial plug and laterally between the two fins.
Claims20
A method, comprising:
- providing a structure having two fins extending from a substrate and an isolation structure adjacent to lower portions of the fins;
- forming a cladding layer over top and sidewalls of the fins and exposing the isolation structure;
- recessing the isolation structure using the cladding layer as an etch mask to expose the substrate;
- after the recessing of the isolation structure, depositing a seal layer over the substrate, the isolation structure, and the cladding layer;
- forming a sacrificial plug over the seal layer and between the two fins;
- and
- depositing a dielectric top cover over the sacrificial plug and laterally between the two fins.
A method, comprising:
- providing a structure having two fins extending from a substrate and an isolation structure adjacent to lower portions of the fins, wherein each of the fins includes first semiconductor layers and second semiconductor layers alternately stacked one over another;
- forming a cladding layer over top and sidewalls of the fins and exposing the isolation structure;
- recessing the isolation structure using the cladding layer as an etch mask to expose the substrate;
- forming a seal layer over the substrate, the isolation structure, and the cladding layer;
- forming a sacrificial plug filling space between the seal layer over opposing sidewalls of the two fins, wherein a top surface of the sacrificial plug is below a topmost layer of the first semiconductor layers;
- depositing a dielectric top cover over the sacrificial plug;
- and
- forming a high-k dielectric helmet over the dielectric top cover and the seal layer, resulting in dielectric fins comprising the seal layer, the dielectric top cover, and the high-k dielectric helmet.
A method, comprising:
- providing a structure having two fins extending from a substrate and an isolation structure adjacent to lower portions of the fins;
- forming a cladding layer over top and sidewalls of the fins and exposing the isolation structure;
- recessing the isolation structure using the cladding layer as an etch mask to expose the substrate;
- after the recessing of the isolation structure, depositing a seal layer over the substrate, the isolation structure, and the cladding layer;
- forming a sacrificial plug over the seal layer and between the two fins;
- depositing a dielectric top cover over the sacrificial plug and laterally between the two fins;
- thinning down the substrate from a backside of the structure until the fins are exposed;
- forming a backside dielectric layer over the backside of the structure;
- performing a chemical mechanical planarization process to the backside of the structure until the sacrificial plug is exposed;
- removing the sacrificial plug, resulting in a trench from the backside of the structure;
- and
- sealing the trench with a dielectric bottom cover, resulting in an air gap surrounded by the seal layer, the dielectric top cover, and the dielectric bottom cover.
Dependencies are inferred from the claim text.