Semiconductor package having exposed redistribution layer features and related methods of packaging and testing
AssigneeMicrochip Technology Incorporated
InventorManKit Lam
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AssigneeMicrochip Technology Incorporated
InventorManKit Lam
Estimating the term…
A method of packaging a semiconductor device having a bond pad on a surface thereof includes forming a redistribution material electrically coupled to the bond pad, forming a dielectric material over the redistribution material, and removing a first portion of the dielectric material to expose a first portion of the redistribution material. Semiconductor packages may include a redistribution layer having a first portion adjacent and coupled to a first contact of the package, a second portion exposed by a first opening in a dielectric material, and a redistribution line electrically coupled to a first bond pad, the first portion, and the second portion. Such a package may be tested placing at least one probe needle in contact with at least one terminal of the package, providing a test signal from the probe needle to the package through the terminal, and detecting signals using the needle.
A method of packaging a semiconductor device having at least one testing bond pad and at least one functional bond pad on an active surface of the semiconductor device, wherein the at least one testing bond pad to enable testing the semiconductor device and the at least one functional bond pad to, among other functions, enable reprogramming of circuitry of the semiconductor device, the method comprising:
An apparatus, comprising:
A method, comprising:
A method, comprising:
Dependencies are inferred from the claim text.