IR drop analysis based on sensitivity analysis and visualization

An apparatus comprising instructions stored on non-transitory storage media, said instructions when executed to cause at least one processor to:

• receive digital values from a post-layout netlist file, the digital values representing parasitic elements in a given electronic circuit design;
• process the digital values to calculate a voltage drop and to calculate sensitivity of the voltage drop to a subset of the parasitic elements;
• and
• cause a display device to render a display image for visual presentation to a user on a display monitor, the display image being formatted to display to the user information dependent on the calculated sensitivity.

An apparatus comprising instructions stored on non-transitory storage media, said instructions when executed to cause at least one processor to:

• receive digital values from a post-layout netlist file, the digital values representing parasitic elements in a given electronic circuit design;
• process the digital values to calculate a voltage drop and to calculate sensitivities of the voltage drop to respective subsets of the parasitic elements;
• and
• cause a display device to render a display image for visual presentation to a user on a display monitor, the display image being formatted to display to the user information dependent on the calculated sensitivities;
• wherein the post-layout netlist file is embodied in a file format compatible with one of the Detailed Standard Parasitic Format (DSPF), the Standard Parasitic Exchange Format (SPEF), the Open Access (OA) extracted view format, the Standard Parasitic Format (SPF), the Simulation Program with Integrated Circuit Emphasis (SPICE) netlist format.