Method and system for intelligent failure diagnosis center for burn-in devices under test

A system comprising:

• a processor;
• a data bus coupled to the processor;
• a network interface, coupled to the data bus and a network, and configured to communicate via the network with a burn-in test monitoring system, a material handling system, and a device repair system, wherein
• the burn-in test monitoring system is coupled to one or more devices under burn-in testing, and
• the devices under burn-in testing each comprise one or more components;
• and
• a non-transitory, computer-readable storage medium embodying computer program code, the non-transitory, computer-readable storage medium being coupled to the data bus, the computer program code interacting with a plurality of computer operations and comprising instructions executable by the processor and configured to:
• monitor status of the one or more devices under burn-in testing,
• determine that a device under test (DUT) of a first type of the one or more devices under testing has failed one or more burn-in tests,
• diagnose one or more causes of the failure of the one or more burn-in tests by the DUT of the first type, wherein said diagnosing is performed using a probabilistic machine learning system trained from a historical set of burn-in test failure data of devices of the first type, the historical set of burn-in test failure data comprising historical failure logs, configuration file records and historical repair data;
• transmit instructions to an automated guided vehicle (AGV) to report to a burn-in rack associated with the failed DUT and to transport the failed DUT to a selected device repair station;
• and,
• transport the failed DUT to the selected device repair station via the AGV.